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CNC Engineering - Nikon Metrology
E-News |
September 2010 |
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Product News
IMTS
2010
LC
scanners
MMDx
Rapidform
Nexiv
VMZ-K6555
Application
News
Philips
Lighting
Chesapeake
Testing
Joe
Gibbs Racing
In
the press
Nikon
Metrology
Solutions
brochure
Nikon
Metrology
News Vol.5
Nikon Metrology
blog
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 Nikon Metrology exhibits two
booths at IMTS 2010
At the
largest US manufacturing trade show, Nikon Metrology,
Inc. showcases its entire portfolio of tactile, laser,
vision, x-ray and computer tomography measuring solutions. East
Hall Booth #5325 visitors can check out the all-digital LC60D and
ModelMaker MMDx laser scanners, which excel in scanning speed,
accuracy and flexibility. Booth #6260 located in the North exhibit
hall exclusively houses innovative large-scale metrology
systems.
Read more about latest
products in this newsletter.
Visit
event website
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New digital LC scanners increase
inspection accuracy
The
next-generation LC60Dx CMM laser scanner brings laser scanning in
the accuracy range of tactile measurement. The LC50Cx benefits
from an upgraded scanning rate and Enhanced Sensor Performance to
scan any material.
Read
more
Visit website
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Scan any surface with the digital
MMDx scanner
ModelMaker
MMDx handheld scanners now incorporate high-performance digital
camera technology and ESP3. Combined with an articulated arm or
K-Series Optical CMM, MMDx efficiently scans different sample
materials and surface finishes.
Read
more
Visit website
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Rapidform to interface directly
with Nikon Metrology handheld laser scanners
Rapidform users are able to take scans and have
the acquired data readily available from within XOR/Redesign and
XOV/Verifier. The new Focus Handheld Scanning application
programming interface (API) manages this process seamlessly,
ensuring highest scan data accuracy and reliability.
Read
more
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New Confocal NEXIV VMZ-K6555
measurement possibilities for demanding
applications
Incorporating
Nikon’s latest confocal image processing and Through The Lens
(TTL) laser technologies, this system achieves faster and more
accurate non-contact 3D measurements on larger size substrates,
probe cards, etc.
Read
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Philips Lighting Turnhout pushes
innovation using X-ray and CT
By investigating high-intensity discharge (HID)
lamp prototypes, Philips engineers push the boundaries of lamp
performance, lifespan and ecological material usage. They also
succeed in reducing extensive life testing, thus saving
tremendously on energy cost.
Read
more
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Chesapeake Testing purchases the
most powerful industrial microfocus CT system in North America
Chesapeake Testing
primarily selected the powerful Computer Tomography (CT)
inspection system for its highly accurate 450kV source, the only
microfocus X-ray source at this energy. The system’s powerful
source, walk-in bay and Panel Shift capability allow customers to
scan wide parts made of dense materials.
Read
more
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AZ100 microscope helps Joe Gibbs
Racing drive for the checkered flag
Engineers of NASCAR racing team Joe Gibbs Racing
(JGR) used the AZ100 multi-purpose microscope to analyze failed
race car rocker arms. Digital images with great contrast and high
resolution instantly revealed the source of the problem, and
allowed the rocker arm design to be altered
immediately.
Read
more
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